Electronic circuit-comp test set (NSN 6625-01-287-3379)
Part Name Assigned By Controlling Agency
Test set electronic 115/120v 50/60 hz sgl phase w/case or cover
General Description
For testing capacitors for shorts, opens and leakage from 0.001 micro f to 25 f; tests resistance circuits for shorts and/or opens; tests semiconductor devices for leakage, shorts and open bonding, to include zenec diodes, bipolar transistor, triacs, and optoelectronic devices; tests integrated circuits for component failure; w/three selectable impedance ranges and output frequency ranges; operated from 115/120 volts, 50/60 hz, single phase; w/protection cover or carrying case; designed to test unpowered circuits and devices in maintenance support of medical equipment
