Electronic systems test set (NSN 6625-01-321-4679)
Major Components
Current source; current monitor; voltmeter; switching/amplifier module; cabinet; rack mounting kits; cables; power control panel; software of ibm pcsingle user license
Inclosure Feature
Multiple item w/housing
Test Type For Which Designed
Hall effect resistivity/mobility measurements in bar and wafer samples of gallium and other compounds
