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Semiconductor Device Test Sets
Part 370A-1P
Model #370A-1P
Semiconductor device test set (NSN 6625-01-419-8132)
End Application
Common test equipment
Inclosure Feature
Multiple item w/housing
Test Type For Which Designed
Parameter charactization of semiconductor devices
Purchase Description Identification
1t110contract/f41608-94-c-0785
Description
Test Set,semiconductor Device
Cage Code
80009
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Part Number:
370A-1P
NSN 6625-01-419-8132
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Updated: 05/19/2024