Semiconductor device test set (NSN 6625-01-259-8161)
Special Features
Opr temp 0 - 55 degrees c; type of tests: izi-theda, iyi-theda, iri-theda r-x, g-b, ix-iy, l-r x g x d x q c-r x g x d x q; -40 to +40 vdc bias internal and external; +.1 amps dc max for dc bias; internal, external, or manual trigger
Width
425.5 millimeters
Ac Voltage Rating
Between 100.0 volts and 240.0 volts
Frequency Rating
Between 48.0 hertz and 66.0 hertz
Depth
574.0 millimeters
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Rf impedance; semiconductor measurement
Phase
Two
Functional Description
Performs analysis of 14 parameters with 4.5 digit resolution across a 1 to 1000 mhz freq range
