Model #5999965

Semiconductor device test set (NSN 6625-00-222-1117)

Enamel surface treatment.

Width

4.250 inches

Length

5.500 inches

Joint Electronics Type Designation System Item Name

Test set, semiconductor device

Joint Electronics Type Designation System Item Type Number

Ts-3253/tpm-39

Material And Location

Aluminum housing

Inclosure Feature

Single item w/housing

Test Type For Which Designed

Microwave diode current

Operating Test Capability

Microamphere meter range 0-1000 ua dc

Height

3.880 inches

Surface Treatment

Enamel

Fsc Application Data

Test set, elect. Equip.

Description

Test Set,semiconductor Device

Cage Code

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