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Semiconductor Device Test Sets
Part 99-0376
Model #99-0376
Semiconductor device test set (NSN 6625-01-535-5582)
Special Features
Max probing area: 15.3" x 12.9"; max component height: 2.375"; computer interfaces: rs232 and pci bus
Ac Voltage Rating
115.0 volts and 230.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Electrical Power Source Relationship
Operating
Test Type For Which Designed
Automated test probe for printed circuit cards
Part Name Assigned By Controlling Agency
Access automated probing station
Phase
Single
Description
Test Set,semiconductor Device
Cage Code
57705
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Part Number:
99-0376
NSN 6625-01-535-5582
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Updated: 05/19/2024