Semiconductor device test set (NSN 6625-01-380-3727)
Special Features
Unit requires ibm compatible compter and monitor; probe inputs: 2 banana jacks and 1 bnc connector; scanner inputs: 16, 30, 40, and 64 input connections; rs232 interface at 9600 baud; database management system for failure history and statistical reports
Width
12.250 inches
Ac Voltage Rating
Between 85.0 volts and 250.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Depth
12.250 inches
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Impedance range: 100k, 10k, 1k, and 100 ohms; test frequencies: 60, 2000 hz sinewave
Phase
Single
Functional Description
General purpose troubleshooting system designed to test a variety of electronic circuits using menu driven software
