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Measuring And Testing
Semiconductor Device Test Sets
Part S250
Model #S250
Semiconductor device test set (NSN 6625-01-201-0653)
Ac Voltage Rating
115.0 volts
Frequency Rating
60.0 hertz
Major Components
Vmicrozoom microscope; s-930v finemotion micropositioner; sm-sp spung loaded probe tip holder; se-tz 5 micron tungsten probe tip; se-10tz 1 micron tungsten probe tip; s-2715 socket card adapter; s-vac vacuum pump w/10 ft. Oftubing
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Submicron geometry of integrated circuit chips
Description
Test Set,semiconductor Device
Cage Code
51511
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Part Number:
S250
NSN 6625-01-201-0653
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Updated: 05/19/2024