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Measuring And Testing
Semiconductor Device Test Sets
Part TF26
Model #TF26
Semiconductor device test set (NSN 6625-00-528-6768)
Special Features
Go/no go test in or out of circuit; connect test leads in any order ; rotating switch; order probe separately for testing pc boards
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Transistor tester
Phase
Single
Description
Test Set,semiconductor Device
Cage Code
33347
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Part Number:
TF26
NSN 6625-00-528-6768
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Updated: 05/07/2024