Model #298-2320

Semiconductor device test set (NSN 6625-01-460-7146)

Special Features
Built-in pulse generator

Width

11.450 inches

Ac Voltage Rating

100.0 volts and 230.0 volts

Frequency Rating

60.0 hertz

Major Components

Tr210; instruction manual; one set atl25 test probes; common test leads; two mini-clip leads; u.S. Power cord

Depth

10.200 inches

End Application

Used with tds210 or tds 220 digital real time oscilloscopes

Electrical Power Source Relationship

Operating

Inclosure Feature

Single item w/housing

Test Type For Which Designed

Current voltage analog signature

Operating Test Capability

Test frequency 50 hz or 60 hz, 200 hz, 2, 000 hz; pulse generator 0 v to5 v

Phase

Two

Functional Description

Provides advanced troubleshooting capabilities to simplify testing of cmos and mos circuits; troubleshoots gate-fired scrs, triacs, and opto-couplers

Height

2.450 inches

Description

Test Set,semiconductor Device

Cage Code

FA0Q5

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