Model #4010-01

Semiconductor device test set (NSN 6625-01-433-2218)

Special Features
Open circuit voltage rise rate 200 v/s, 1000 v/s; output voltage 1000v; usable measuring range 10-1000 volts; test current for solid state protectors 1 ma at 10 pct; measurement accuracy .5 pct; 3 nema 5024 lithium batteries; storage temp m10 to 60 degrees c; operating temp 0 to 50 degrees c
End Application
Milstar af terminal remoting syst m (maftrs)
Electrical Power Source Relationship
Operating
Internal Battery Accommodation
Included
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Zener diodes testing in high altitude electromagnetic pulse (hemp) filters in milstar af terminal remoting system
Functional Description
Uses a linear volt ramp generator, a low voltage capacitive discharge, current limit element, 1 mamp current detection & control circuit, & peak read metering system
Supplementary Features
Used in conjunction with rockwell built hemp filter test set; josyln calls this a surge protector test set
Description
Test Set,semiconductor Device
Cage Code
32997

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Updated: 05/03/2024