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Measuring And Testing
Semiconductor Device Test Sets
Part 575M0D122C
Model #575M0D122C
Semiconductor device test set (NSN 6625-00-808-1801)
Width
16.750 inches
Length
24.000 inches
Ac Voltage Rating
Between 105.0 volts and 125.0 volts
Frequency Rating
Between 50.0 hertz and 60.0 hertz
Electrical Power Source Relationship
Operating
Internal Battery Accommodation
Not included
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Dynamic characteristic curves of junction and point contact transistors
Phase
Single
Functional Classification
Aa-3.3
Functional Description
Used in checking and matching transistors in power supplies of gp-4
Height
13.000 inches
Entry Date
70-04-01
Reference Data And Literature
T.O. 33a1-12-511-11
Relationship To Similar Equipment
When exhausted use 6625002023475
Description
Test Set,semiconductor Device
Cage Code
80009
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575M0D122C
NSN 6625-00-808-1801
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Updated: 05/05/2024