Model #5999965

Semiconductor device test set (NSN 6625-00-222-1117)

Description

Enamel surface treatment.

Width
4.250 inches
Length
5.500 inches
Joint Electronics Type Designation System Item Name
Test set, semiconductor device
Joint Electronics Type Designation System Item Type Number
Ts-3253/tpm-39
Material And Location
Aluminum housing
Inclosure Feature
Single item w/housing
Test Type For Which Designed
Microwave diode current
Operating Test Capability
Microamphere meter range 0-1000 ua dc
Height
3.880 inches
Surface Treatment
Enamel
Fsc Application Data
Test set, elect. Equip.
Description
Test Set,semiconductor Device
Cage Code
24930

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Updated: 11/23/2024