Model #851

Semiconductor device test set (NSN 6625-00-087-2973)

Width
250.0 millimeters
Ac Voltage Rating
115.0 volts
Frequency Rating
60.0 hertz
Depth
286.0 millimeters
End Application
Nsn 5826-00-117-7747 calibration bench mock up
Electrical Power Source Relationship
Operating
Inclosure Feature
Single item w/housing
Test Type For Which Designed
In-circuit testing of components
Phase
Single
Height
86.0 millimeters
Reference Data And Literature
To 33a1-15-55-4
Description
Test Set,semiconductor Device
Cage Code
20747

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Updated: 11/28/2024