Model #99-0376

Semiconductor device test set (NSN 6625-01-535-5582)

Special Features
Max probing area: 15.3" x 12.9"; max component height: 2.375"; computer interfaces: rs232 and pci bus

Ac Voltage Rating

115.0 volts and 230.0 volts

Frequency Rating

Between 50.0 hertz and 60.0 hertz

Electrical Power Source Relationship

Operating

Test Type For Which Designed

Automated test probe for printed circuit cards

Part Name Assigned By Controlling Agency

Access automated probing station

Phase

Single

Description

Test Set,semiconductor Device

Cage Code

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Updated: 11/26/2024