Model #LCR55A

Semiconductor device test set (NSN 6625-01-568-3263)

Width
38.0 millimeters
Length
183.0 millimeters
Depth
79.0 millimeters
Test Type For Which Designed
Inductance, coapacitance, resistance, transistors, diodes
Description
Test Set,semiconductor Device
Cage Code
44D86

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Updated: 11/24/2024