Diffraction pat measuring device (NSN 6650-01-250-1243)
General Description
C/o densitometer and recorder; determins rate of d spacings from electron and x-ray diffraction patterns; automatically produces permanent expanded chart record of variations in film density along selected track; chart may be read to line spacing of between 0.05 and 0.10 mm for d value determinations; outer support ring has 360 degrees protractor scale; bench sz 44 x 16 in.