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Measuring And Testing
Semiconductor Device Test Sets
Part 403-6983
Model #403-6983
Semiconductor device test set (NSN 6625-01-239-4638)
Width
9.000 inches
Frequency Rating
Between 50.0 hertz and 2000.0 hertz
Depth
11.000 inches
Electrical Power Source Relationship
Alternate operating
Inclosure Feature
Single item w/carrying case
Test Type For Which Designed
Leakage, bonding, failure, shorts, opens
Height
4.000 inches
Supplementary Features
Impedance ranges: open circuit voltage 10vp, 15vp, 20vp, 60vp; short circuit current 135marms, 9.0marms, 0.6marms
Description
Test Set,semiconductor Device
Cage Code
A486G
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403-6983
NSN 6625-01-239-4638
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Updated: 09/29/2024